reference: ISO/TC 201/SC 10
title: X-ray Reflectometry (XRR) and X-ray Fluorescence (XRF) Analysis
scope: Standardization of methods for instrument specification, instrument calibration, instrument operation, data acquisition, data processing, and data analysis in the use of X-ray Reflectometry (XRR) and X-ray Fluorescence (XRF) Analysis for surface chemical and structural analysis.
committeeLiaisons: ISO/TC 147
committeeLiaisons: ISO/TC 202
committeeLiaisons: ISO/TC 229